The Scientific Imaging Center (SIC), Institut Teknologi Bandung (ITB), successfully organized Workshop Series II: Explore the Nano World with the Cutting-Edge Scanning Electron Microscope on 27–28 May 2025. The two-day workshop was designed to expand participants’ knowledge and practical skills in electron microscopy, focusing on the applications of the Thermo Scientific Phenom XL G2 Desktop Scanning Electron Microscope (SEM) for materials science research and characterization.

The workshop featured lectures and hands-on training sessions delivered by Prof. Dr. Suprijadi, M.Eng., Lecturer at the Department of Physics, FMIPA ITB, and Fitria Dwi Ayuningtyas, Ph.D., Facility Manager of the Scientific Imaging Center. The lecture sessions introduced participants to the fundamental principles of scanning electron microscopy, its role in materials characterization, and emerging applications of SEM in multidisciplinary scientific research.

A total of 21 participants attended the workshop, representing universities, research institutions, and laboratories from across Indonesia. Participants came primarily from Institut Teknologi Bandung (ITB), Universitas Padjadjaran, BRIN, Universitas Hang Tuah, and several other academic and research organizations. The diverse participant backgrounds, ranging from students and researchers to laboratory professionals, highlighted the increasing importance of SEM technology in both research and industrial applications.

The workshop emphasized the critical role of Scanning Electron Microscopy (SEM) as a primary analytical tool for investigating material structures and surface morphology from the micro- to nanoscale. Through comprehensive lectures, participants gained an understanding of SEM operating principles, imaging modes, sample preparation requirements, and image interpretation techniques that are essential for accurate materials analysis.

In addition to the theoretical sessions, participants engaged in interactive hands-on training using the Thermo Scientific Phenom XL G2 Desktop SEM. Practical activities included sample preparation techniques, instrument operation, image acquisition, and basic material characterization workflows. These sessions provided participants with valuable direct experience in utilizing SEM technology for research and development purposes.

By integrating lectures with practical demonstrations, the workshop successfully enhanced participants’ understanding of electron microscopy and strengthened their competency in advanced imaging techniques. The program also reinforced SIC’s mission to provide access to state-of-the-art scientific instrumentation while fostering collaboration among researchers, academics, and industry professionals.

Through initiatives such as Workshop Series II, SIC continues to strengthen its role as a national hub for scientific imaging, advanced microscopy training, and interdisciplinary research collaboration in Indonesia.

Workshop Highlights

• Event: Workshop Series II – Explore the Nano World with the Cutting-Edge Scanning Electron Microscope
• Date: 27–28 May 2025
• Venue: Scientific Imaging Center (SIC), Institut Teknologi Bandung
• Participants: 21 researchers, students, and laboratory professionals
• Speakers: Prof. Dr. Suprijadi, M.Eng. and Fitria Dwi Ayuningtyas, Ph.D.
• Instrument: Thermo Scientific Phenom XL G2 Desktop Scanning Electron Microscope
• Topics Covered: SEM principles, materials characterization, sample preparation, imaging techniques, and data interpretation
• Outcome: Improved participant competency in electron microscopy and nanoscale materials analysis

The successful implementation of this workshop demonstrates SIC’s ongoing commitment to advancing microscopy education, supporting high-quality research, and developing Indonesia’s scientific imaging ecosystem.