About

XL G2 Desktop SEM supports efficient and reproducible electron microscopy workflows by integrating imaging, automation, and elemental analysis within a single platform. Through the Phenom Programming Interface (PPI), users can automate repetitive analyses such as particle, pore, fiber, improving consistency and throughput. A long-lifetime CeB₆ electron source provides stable, high-brightness imaging for detailed surface observation with reduced maintenance requirements. An optional eucentric sample holder enables sample tilting and rotation while maintaining the region of interest, facilitating accurate structural analysis. When equipped with EDS and Element Identification (EID) software, the system allows guided elemental characterization alongside SEM imaging in the same workspace, minimizing sample handling and supporting research on sensitive materials, including those requiring controlled environments such as glove boxes or dry rooms.

Features

Electron Optics

• Long-lifetime thermionic electron source (CeB₆)
• Multiple selectable beam currents

Magnification Range

• Electron optical magnification: 160× – 200,000×
• Light optical magnification: 3× – 16×

Resolution

• Spatial resolution: < 10 nm

Image Resolution Options

• 960 × 600 pixels
• 1920 × 1200 pixels
• 3840 × 2400 pixels
• 7680 × 4800 pixels

Acceleration Voltage

• Default modes: 5 kV, 10 kV, 15 kV, 20 kV
• Advanced mode: adjustable from 4.8 kV to 20.5 kV (imaging and analysis)

Vacuum Modes

• Low vacuum
• Medium vacuum
• High vacuum

Detectors

• Backscattered Electron (BSE) detector — standard
• Secondary Electron (SE) detector — optional
• Energy-Dispersive X-ray Spectroscopy (EDS) detector — optional

Sample Capacity

• Maximum sample size: 100 mm × 100 mm
• Supports up to 36 × 12 mm pin stubs
• Maximum sample height: 40 mm

Sample Requirements

• Samples must be dry prior to SEM observation.
• Samples can be analyzed with or without conductive coating (depending on sample).